Senior Research Fellow (Microelectronics Failure Analysis & Reliability)
The School of Materials Science and Engineering (MSE) provides a vibrant and nurturing environment for staff and students to carry out inter-disciplinary research in key areas such as Computational Materials Science, Characterisation Materials Science, Defence Composite Materials, Functional Composite Materials, Energy, Nanomaterials, Low Dimensional Materials, Biomaterials Materials, Biological Materials, Bioinspired Materials and Sustainable Materials.
We are looking for a Senior Research Fellow in Microelectronics Failure Analysis and Reliability to be the lead researcher in a new industry-sponsored project. The role will focus on carrying out failure analysis of various semiconductor devices, from silicon to III-V compound semiconductors, to understand the root cause of failure, as well as conduct reliability tests and analysis.
Key Responsibilities:
Lead an industry-funded project focusing on device reliability testing and failure analysis.
Analyze and manage large and diverse datasets from reliability tests, presenting distilled insights and constructive recommendations.
Develop and implement advanced characterization and failure analysis methodologies to improve device performance and reliability of Si and III-V semiconductor devices.
Collaborate with academic/research institutions and industry partners to enhance understanding of failure mechanisms in Si and III-V semiconductor devices.
Prepare reports and presentations for project updates
Publish research findings in peer-reviewed journals and present at international conferences.
Provide mentorship to undergraduate/postgraduate students in research activities.
Assist in research proposal writing
Support in lab management matters, including lab safety, equipment maintenance, procurement of materials
Job Requirements:
A PhD in Materials Science, Electrical Engineering, or a related field.
At least 8 years of research experience after PhD
At least 4 years of experience with Si or III-V semiconductor device failure analysis and reliability testing.
Strong knowledge of Si/III-V semiconductor device physics, particularly fabrication processes, is a plus.
Hands-on experience with advanced failure analysis techniques, such as wet/plasma etching and analytical tools (e.g., SEM, FIB-SEM, TEM, PEM, and AFM).
Handson experience with electrical device characterization and/or accelerated stressing
Ability to prepare detailed technical reports and presentations, confidently defending data analysis and conclusions during technical discussions.
Ability to build rapport and influence stakeholders at all levels
Ability to work collaboratively in a fast-paced environment.
Self-driven and capable of meeting deadlines with high-quality outcomes.
We regret to inform that only shortlisted candidates will be notified.
Hiring Institution: NTU